Tag: rfid


The Year Ahead in LP

These are clearly turbulent times in retail. How people shop is changing—and with it the strategies employed to attract and retain customers. Store technology is changing, offering new opportunities, and ushering in new risks. What does the upheaval mean for loss prevention? What are the primary challenges the industry may   Read More


Test, Do, Learn, and Share

Over the years, enterprise needs for supply-chain asset protection (SCAP) have undergone a transformation from lock-and-key security operations to more integrated supply-chain security and facilitation networks. By taking advantage of the latest technology, this evolution is possible. However, too many organizations look to technology as a cure-all. This leads to   Read More


Closing a Retail Store: Loss Prevention’s Role

Closing a Retail Store: Loss Prevention’s Role

Senior loss prevention executives throughout retail are coming to grips with a new entry into the field of promotional sale events—the all-too-frequent store-closing sale.

It is no longer a rarity that LP managers are called upon to design and implement shrink-control programs that protect inventories throughout the process of closing a retail store. Often, a   Read More


Recapping Fifteen Years of LP Magazine

Recapping Fifteen Years of LP Magazine

Bill Turner, LPC, has been a reader and contributor to Loss Prevention magazine (now LP Magazine) since its inception in 2001. Now, as the publication celebrates its 15-year anniversary, Turner looks back at the publication’s past five years in a feature article in the January-February 2017 issue. This third and   Read More


Improving Retail Employee Engagement Can Help Manage Loss

Improving Retail Employee Engagement Can Help Manage Loss

For the majority of retailers, loss is an inevitable part of doing business. What form this loss takes and, critically, how much it costs the business varies enormously depending upon the type of retailer and the quality of their operations. In addition, the customer experience is often heavily dependent upon   Read More